Aberration-corrected Analytical Electron Microscopy by Rik Brydson

By Rik Brydson

The publication is worried with the speculation, history, and useful use of transmission electron microscopes with lens correctors that could right the consequences of round aberration. The booklet additionally covers a comparability with aberration correction within the TEM and functions of analytical aberration corrected STEM in fabrics technological know-how and biology. This booklet is key for microscopists enthusiastic about nanoscale and fabrics microanalysis specially these utilizing scanning transmission electron microscopy, and similar analytical strategies similar to electron diffraction x-ray spectrometry (EDXS) and electron strength loss spectroscopy (EELS).

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Extra resources for Aberration-corrected Analytical Electron Microscopy

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In a conventional scanning electron microscope (SEM) an electron probe is focussed by an objective lens onto the surface of a sample and this probe is scanned in a raster across the surface. The secondary electron signal from the entrance surface is collected by a detector and displayed in a similar raster on a cathode ray tube (CRT) or frame store. 11). However there is a limit to the minimum size of the probe, and hence the resolution, achievable for a certain value of the probe current, and hence contrast level which is required in order to image a particular feature, as explained in the last section and in Chapter 1.

Crystalline materials) such transforms (power spectra corresponding, of course, to diffraction patterns of the same area of the specimen) can be used to filter out ‘noise’ before back-transformation into a ‘better’ image. Commercial programs such as Digital Micrograph (Gatan Inc. com) do this sort of thing, and a lot more, extremely efficiently. However the microscopist must always be aware of the potential for introducing artefacts during what might all too easily be used as ‘black box’ processing.

Rotationally symmetric electromagnetic lenses consist of a wound coil through which a current is passed. Electrons passing through the coil undergo a focusing effect which is dependent on the coil current and which can be increased by increasing the concentration of the resultant magnetic field with a soft iron pole piece. 4). 4 A schematic (cut-away) diagram of a rotationally symmetric electron lens. 5 Schematic diagram of a quadrupole lens configuration. which the iron alloy pole pieces are replaced by components containing rare-earth materials with a higher saturation magnetisation.

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